100-Percent Testing of the Layer Thickness
Polytec at K 2019
Photothermal contactless measurement is suitable for layers from 0.1 µm to 1 mm thickness (© Polytec)
Besides defects, the layer thickness distribution also determines the quality of a film. With thin semi-finished products and films, contact thickness measurement has disadvantages, since the measurement unit leaves behind pressure marks, or the product may tear. One option for contactless thickness measurement consists in measuring the values photothermally, i.e. irradiating the measurement point with laser and determining the cooling rate, and thereby the layer thickness, from the reflected IR radiation.
Polytec GmbH, Waldbronn, Germany, presents the layer thickness measurement device from Enovasense, Villejuif, France, which was developed for non-transparent and semi-transparent layers. By measuring the thermophysical characteristics, the system can be used for very different materials, so that also coatings and metalization on plastic surfaces can also be measured.
K 2019: Hall 11, booth H03
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