Inline Measurement of Layer Thickness
Capacitive and IR Measurement Method Combined
Nowadays it is essential to determine the EVOH layer distribution to deliver a consistent quality. In most case of applications, the EVOH thickness is determined in laboratories by microscopes. SBI Produktion techn. Anlagen GmbH & Co KG, Hollabrunn, Austria, delivers an in-line, non-contact and user-friendly thickness measurement to control the EVOH barrier layer during the production process.
Capacitive and IR Measurement Method
SBI is a producer of inline thickness measuring devices for film and sheet extrusion. The new developed gauge (Kapa-IR) contains the capacitive measurement process and in addition to it also a special infrared (IR) which is a sensor system that determines the EVOH layer thickness.
This additional measurement system makes it possible to detect the EVOH layer of transparent and opaque multi-layer plastics. To determine the EVOH layer thickness, a wide infrared spectrum of the plastic is recorded and the resulting absorption of the EVOH polymer molecules is evaluated by using modern analytical methods.
Not just for Polypropylene
SBI mainly focuses with this measuring system on measuring PP/EVOH/PP sheets, but it is also possible to gauge other EVOH-polymer compounds with the help of extended analysis-algorithms.
The gauge measures the total thickness of multi-layer sheets in microns, the die bolts over the measuring width, and in addition to it the EVOH layer distribution.
The infrared measuring system is a relative measurement and yields the absolute EVOH layer thickness by the means of calibration.
SBI Produktion techn. Anlagen GmbH
Patents encourage innovation: Stay on the ball with the latest innovations in the plastics industry in our patents section.
Would you like to subscribe to our Newsletters on plastics technology and profit from the latest information?
You know the trade name but want to know the material manufacturer, type of polymer and delivery form? Search here!