back to top
My wish lists
Save your wish list
If you want to add more content to your wish list, simply log in. If you do not have a user account, please register for the Hanser Customer Center.

» Do you already have a user account? Please log in here.
» Don't have a user account yet? Please register here.
Your wish lists
If you want to use your wish list during your next visit, simply log in. If you do not have a user account, please register for the Hanser Customer Center.
» Do you already have a user account? Please log in here.
» Don't have a user account yet? Please register here.

« Back

Your advantages at a glance

  • One login for all Hanser portals
  • Individual home page for faster access to preferred content
  • Exclusive access to selected content
  • Personal wish lists on all portals
  • Central management of your personal information and newsletter subscriptions

Register now
Deutsch
Bookmark Bookmarked
02-19-2019

Inline Measurement of Layer Thickness

Capacitive and IR Measurement Method Combined

Nowadays it is essential to determine the EVOH layer distribution to deliver a consistent quality. In most case of applications, the EVOH thickness is determined in laboratories by microscopes. SBI Produktion techn. Anlagen GmbH & Co KG, Hollabrunn, Austria, delivers an in-line, non-contact and user-friendly thickness measurement to control the EVOH barrier layer during the production process.

  • Thickness measuring device for detecting the EVOH barrier layer (© SBI)

  • Measuring result: display for total thickness (above), bolt (middle) and EVOH thickness (© SBI)

1 | 0

Commercial - the next slide will be displayed in seconds - skip

Commercial - the next slide will be displayed in seconds - skip

Capacitive and IR Measurement Method

SBI is a producer of inline thickness measuring devices for film and sheet extrusion. The new developed gauge (Kapa-IR) contains the capacitive measurement process and in addition to it also a special infrared (IR) which is a sensor system that determines the EVOH layer thickness.

This additional measurement system makes it possible to detect the EVOH layer of transparent and opaque multi-layer plastics. To determine the EVOH layer thickness, a wide infrared spectrum of the plastic is recorded and the resulting absorption of the EVOH polymer molecules is evaluated by using modern analytical methods.

Not just for Polypropylene

SBI mainly focuses with this measuring system on measuring PP/EVOH/PP sheets, but it is also possible to gauge other EVOH-polymer compounds with the help of extended analysis-algorithms.

The gauge measures the total thickness of multi-layer sheets in microns, the die bolts over the measuring width, and in addition to it the EVOH layer distribution.

The infrared measuring system is a relative measurement and yields the absolute EVOH layer thickness by the means of calibration.

Company profile

SBI Produktion techn. Anlagen GmbH

Kaplanstr. 12
AT 2020 HOLLABRUNN
Tel.: +43 2952 34139-0
Fax: +43 2952 34139-10

These articles might be interesting for you
Patents Stimulate Innovation

Patents encourage innovation: Stay on the ball with the latest innovations in the plastics industry in our patents section.

Patents

Newsletter

Would you like to subscribe to our Newsletters on plastics technology and profit from the latest information?

Subscribe here

Subscribe here

Trade Names

You know the trade name but want to know the material manufacturer, type of polymer and delivery form? Search here!

Trade Names