Surface Analysis: Polymers Under the Chemical Magnifying Glass
To obtain a detailed look at and into the chemical composition of polymers, it is essential to select the most appropriate analytical method. With the aid of X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToFSIMS) properties can be selectively identified, localized and quantified.Beitrag auf Deutsch lesen
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1 Henzler, M.; Göpel, W: Oberflächenphysik des Festkörpers. 2nd Edition Teubner, Wiesbaden, Germany 1994.
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